Malvern Panalytical

Increase your process efficiency and recovery rate X-ray fluorescence spectroscopy (XRF) has an important and well-established analytical role within the mining and minerals industry. It is used extensively for exploration, grade control, process monitoring and assuring that the composition of waste is within the limits of environmental norms and regulations.

Epsilon 4 benchtop spectrometers are used in mining operations, even at remote locations, for fast elemental analysis of ores, minerals and rocks. The combination of low infrastructural demands and the high analytical performance, enables quick determination of operation strategies in mining locations where utilities are limited.

Discover the possibilities of XRF analysis and reduce your feedback time from hours to minutes by placing the benchtop XRF spectrometer next to your mine or processing plant.

Zetasizer Advance is the successor to the highly successful and market-leading Zetasizer Nano.

Each of the three models in the Zetasizer Advance Range offers particle size, particle charge (zeta potential) and molecular weight analysis. In addition, each benefits from advances including Adaptive Correlation, M3-PALS zeta potential analysis, constant current zeta mode and our deep learning-based data quality advice system.

Each of the three models is available as a Blue Label or Red Label variant:

• Choose Blue Label for routine sample investigation such as metallic colloids, metal oxides and pigments
• Choose Red Label for more challenging sample types, such as proteins, surfactant solutions and low solid content samples

All Zetasizer Advance systems offer on-site upgradeability with minimal downtime. Should your needs change, your Zetasizer can adapt to new challenges.

The Multipurpose Solution for Your Analytical Needs

With the Empyrean, PANalytical has set the new standard for a multipurpose diffractometer. In developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects, the PANalytical R&D team has redesigned all key components of the X-ray diffractometer from the ground up.   It is PANalytical’s answer to the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project.

XRD made easy
Meet Aeris – our brand-new X-ray benchtop diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software.

Being a PANalytical product guarantees delivery of the best benchtop data and full automatability for industrial applications. Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions.